Radiation based treatment beam position calibration and verification

ABSTRACT

A phantom is described. The phantom having a spherical phantom body and an X-ray luminescent material, wherein at least a portion of the X-ray luminescent material is on a surface of the phantom.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.15/607,217, filed on May 26, 2017, the contents of which areincorporated in its entirety into this application.

TECHNICAL FIELD

Implementations of the present disclosure relate to radiation basedtreatment beam positions and, in particular, to calibration andverification of radiation based treatment beam positions.

BACKGROUND

A radiation source (e.g., linear accelerator (LINAC)) is used inradiation treatment to apply a beam of highly energized particles (e.g.,a radiation beam) to a target within a patient. A mechanical positioningsystem positions the radiation source (e.g., LINAC) so that theradiation beam is emitted at specific angles and distances (e.g., nodes)relative to the target. Geometric beam delivery accuracy can be improvedby performing calibration and verification of the mechanical positioningsystem.

Calibration techniques may use both a point detector and a raster scan.In a first calibration technique, a surrogate is used for the radiationtreatment beam. A point detector (e.g., photodiode) or radiation sensor(e.g., stereotactic diode detector or point scintillation detector) isplaced at an isocenter of the mechanical positioning system, a surrogate(e.g., a laser beam) for the radiation beam is emitted, a raster scan ofa laser beam (e.g., from a central axis laser) is performed across thepoint detector or radiation sensor (e.g., an initial coarse scan at 0.8millimeter (mm) resolution over a larger region and a subsequent finer0.4 mm resolution scan over a smaller region), and the center of theradiation beam is defined from a resulting maximum optical signalintensity of the surrogate. Axis offsets (used to position the center ofthe radiation beam in the correct location) are determined and stored aspointing offsets to be applied during radiation treatment.

For a point detector, such a calibration and verification method using alaser as a surrogate may take 100-200 minutes for a node-set containing100-200 nodes and 17-33 hours for a node-set for a dynamic pathinvolving 1000 nodes. For a radiation sensor, such a calibration andverification method takes even longer. In the above describedcalibration and verification method, the laser beam acts as a surrogatefor the center of the radiation beam, which introduces the uncertaintyof coincidence of the laser beam and treatment beam (e.g.,laser-to-radiation beam coincidence) in the calibration and verificationresults. Further uncertainty is added by any variation in instantaneouslaser intensity when the maximum optical signal intensity (e.g., peaksignal) is used (e.g., laser intensity stability). Uncertainties mayalso be introduced into the calibration and verification due tosensitivity varying with beam angle of incidence caused by anisotropicconstruction of the radiation sensor (e.g., detector sensitivityvariation with beam orientation).

In a second calibration technique, the radiation treatment beam is useddirectly. A point detector or radiation sensor is placed at an isocenterof the mechanical positioning system, a radiation beam is emitted usingthe LINAC, a raster scan is performed across the point detector orradiation sensor, and the center of the radiation beam is defined from aresulting maximum optical signal intensity. Axis offsets are determinedand stored as pointing offsets to be applied during radiation treatment.For the second calibration technique, there are not uncertainties from alaser-to-radiation beam coincidence, but the uncertainties caused bydose-rate stability and detector sensitivity variation with beamorientation may cause the time required for calibration and verificationunder the second calibration technique to be greater than the timerequired under the first calibration technique.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is illustrated by way of example, and not by wayof limitation, in the figures of the accompanying drawings.

FIG. 1 illustrates a calibration system including one or more camerasand a phantom to calibrate a position of a LINAC, in accordance withimplementations of the present disclosure.

FIG. 2A illustrates a phantom including a spherical phantom body thatincludes an X-ray luminescent material, in accordance withimplementations of the present disclosure.

FIG. 2B illustrates a phantom including a cylindrical phantom body thatincludes an X-ray luminescent material, in accordance withimplementations of the present disclosure.

FIG. 2C illustrates a phantom including a spherical phantom body thatincludes an X-ray luminescent material overlaid with a pattern, inaccordance with implementations of the present disclosure.

FIG. 3A illustrates a calibration system, in accordance withimplementations of the present disclosure.

FIG. 3B illustrates incidence of the radiation beam on the phantomcompared to view of a camera, in accordance with implementations of thepresent disclosure.

FIG. 3C illustrates the view of a camera of incidence of the radiationbeam on the phantom, in accordance with implementations of the presentdisclosure.

FIG. 3D illustrates radiation luminescence generated at an entrancesurface and an exit surface of the phantom, in accordance withimplementations of the present disclosure.

FIG. 3E illustrates a calibration system, in accordance withimplementations of the present disclosure.

FIG. 4 illustrates a flow diagram of a method for calibration of aposition of a LINAC, in accordance with implementations of the presentdisclosure.

FIG. 5A illustrates a flow diagram of a method for calibration of aposition of a LINAC using one or more cameras coupled to the LINAC toacquire images of an entrance surface of the phantom, in accordance withimplementations of the present disclosure.

FIG. 5B illustrates a flow diagram of a method for calibration of aposition of a LINAC using one or more cameras coupled to the LINAC toacquire images of an entrance surface and an exit surface of thephantom, in accordance with implementations of the present disclosure.

FIG. 5C illustrates a flow diagram of a method for calibration of aposition of a LINAC using cameras positioned at static locations toacquire images of an entrance surface of the phantom, in accordance withimplementations of the present disclosure.

FIG. 5D illustrates a flow diagram of a method for calibration of aposition of a LINAC using cameras located at static locations to acquireimages of an entrance surface and an exit surface of the phantom, inaccordance with implementations of the present disclosure.

FIG. 6 illustrates a flow diagram of a method for verification of aposition of a LINAC in accordance with implementations of the presentdisclosure.

FIG. 7 illustrates systems that may be used in performing calibration ofa position of a LINAC, in accordance with implementations of the presentdisclosure.

FIG. 8 illustrates configurations of a calibration system, in accordancewith implementations of the present disclosure.

FIG. 9 illustrates a gantry based intensity modulated radiotherapysystem, in accordance with implementations of the present disclosure.

FIG. 10 illustrates a helical radiation delivery system, in accordancewith implementations of the present disclosure.

DETAILED DESCRIPTION

A radiation source (e.g., LINAC) is used in radiation treatment to applya radiation beam to a target within a patient. Implementations of thedisclosure often reference LINAC for simplicity and brevity, however,the teaching of the present disclosure are applied to radiation sourcesgenerally and can be applied to various types of radiation sources,including for example, LINAC, radioactive isotopes (e.g., cobalt-60),cyclotron, etc. A radiation treatment plan is established by determiningpointing vectors for each trajectory of the radiation beam (e.g., viain-room imaging of the target) and then determining positions of theLINAC (e.g., nodes, angle and distance relative to the target) to bringa radiation beam into coincidence with each pointing vector. Themechanical positioning systems have mechanical settings corresponding topositions of the LINAC. Geometric beam delivery accuracy is an aspect ofany external beam radiation treatment, especially for techniques usinghigh dose gradients and hypofractionation, and can be improved byperforming calibration and verification of each mechanical setting ofthe one or more mechanical positioning systems that position the LINAC.

Calibration of each mechanical setting is defined by the physical designof the delivery system (e.g., LINAC and mechanical positioning systems)and the control systems. To improve accuracy of calibration, devicespecific measurements may be performed and applied as corrections to anoriginal calibration of the mechanical positioning system or used toreplace the original calibration entirely.

Described herein are methods, systems, and phantoms used forradiation-based treatment beam position calibration and verification. Aphantom is a device for simulating the in vivo effect of radiation ontissues by absorbing and scattering x-rays in approximately the same wayas the tissues of the body. The phantom includes an X-ray luminescentmaterial. In one implementation, a phantom is coated with an X-rayluminescent material. In another implementation, a phantom includes anX-ray luminescent material (e.g., the X-ray luminescent material isintegral to the phantom), where at least a portion of the X-rayluminescent material is on the surface of the phantom. One or moreoptical images of the radiation beam incident on the phantom are used tomeasure beam pointing offset. The beam pointing offset is calculatedfrom each image, removing the need for a beam scanning procedure. Afterthe beam pointing offset is applied to corresponding mechanicalsettings, a second image is acquired to measure the effectiveness of thecorrection (i.e., a verification procedure). The verification procedurecan be iterated. The present disclosure is suitable for coplanar andnon-coplanar treatment geometries. Implementations of the presentdisclosure may reduce path calibration time, for example, from about 100minutes to between 10 and 40 minutes for 100 treatment positions.Extrapolating to a larger set of 1000 treatment positions, theimplementations of the present disclosure may require about 2 hoursinstead of about 17 hours utilizing other methods. Alternatively, otherpath calibration times may be achieved. In addition to time saving,implementations of the present disclosure may remove uncertaintiesrelated to laser-to-radiation-beam coincidence and instantaneous laserintensity variation present in other methods.

FIG. 1 illustrates a calibration system 100 including one or morecameras 110 and a phantom 120 used to calibrate a position of a LINAC150, in accordance with implementations of the present disclosure.

The LINAC 150 emits a radiation beam 160 at a target (e.g., a phantom120, a patient, etc.). The LINAC 150 is coupled to a mechanicalpositioning system 170. The mechanical positioning system 170 positionsthe LINAC 150 at one or more nodes (e.g., relative to the phantom 120,relative to an isocenter 174 of the mechanical positioning system 170,etc.). The node may include a distance from the phantom 120 and an anglerelative to the phantom 120. In one implementation, the mechanicalpositioning system 170 includes a robotic arm 172 (e.g., with degrees ofrotation and translation, robotic manipulator joint rotations system, aframeless robotic radiation therapy system (e.g., CyberKnife® roboticradiosurgery system)). In another implementation, mechanical positioningsystem 170 includes a gantry-based system 900 (e.g., a C-arm gantryrotation system, LINAC 150 is coupled to a gantry 903 of gantry basedsystem 900 of FIG. 9, etc.). In another implementation, the mechanicalpositioning system 170 is a helical radiation delivery system 1000 (seeFIG. 10). In another implementation, the mechanical positioning system170 is a couch translation and rotation system. In anotherimplementation, the mechanical positioning system 170 is a gimbal mountmeasurement system. Alternatively, other types of mechanical positioningsystems may be used.

The calibration system 100 includes a camera system 110 having one ormore cameras (e.g., camera 110A, camera 110B, etc.), a phantom 120, anda processing device 130.

In one implementation, one or more cameras 110A are coupled to the LINAC150 (e.g., on a distal end of the LINAC 150 proximate a collimator 152).In another implementation, cameras 110B are located in a static location(e.g., mounted in a location in a treatment room, do not move inresponse to movement of the LINAC 150). In another implementation, oneor more cameras 110 are located on a treatment couch.

In one implementation, the camera system 110 is a visual light camera.In another implementation, the camera system 110 is an infrared camera.In another implementation, the camera system 110 is a charge-coupleddevice (CCD) camera. In another implementation, the camera system 110 isan intensified CCD (ICCD) camera. In another implementation, the camerasystem 110 is an electron multiplied ICCD (emICCD) camera (e.g.,Princeton Instruments PI-MAX4512 EM). In one implementation, the camerasystem 110 may be operated in a pulsed mode gated by the radiation beam160. In another implementation, the camera system 110 is an imagingscintillation or Cerenkov emission detector.

The camera system 110 may be designed to be positioned and shielded tomaximize the lifetime of each camera system 110. In one implementation,camera system 110 is positioned at the exit surface of the LINAC 150, tothe sides of the treatment beam where camera system 110 will be shieldedby the collimator 152. In another implementation, a lens (e.g., Canon EF135 mm f/2L USM) of each camera of camera system 110 is positionedadjacent to the collimator 152 and is shielded from the radiation beam160 by the collimator 152. Each lens may be coupled (e.g., usingfiber-optics) to remotely positioned camera electronics (e.g., optics,an image sensor, an intensifier, and so forth), allowing the cameraelectronics to be positioned at greater distance from the treatmentbeam. The camera electronics may be positioned in a location where spaceand weight are less restricted to allow greater radiation shielding tobe used that at the exit surface of the LINAC 150. In oneimplementation, the camera system 110 is integrated (e.g., permanentlyintegrated, non-removably integrated) into the housing 302 (e.g.,treatment head) of the LINAC 150. The camera system 110 may additionallybe used for one or more of collision avoidance, external patienttracking, entrance patient dosimetry, etc. In another implementation,the camera system 110 is mounted on a removable accessory that attachesto the housing 302 (e.g., head) of the LINAC 150 for calibration. Thecamera system 110 may be removed during treatment to minimize radiationdose to which the camera system 110 is exposed and may extend thelifetime of the camera system 110.

In one implementation, the phantom 120 is mechanically positioned arounda reference point (e.g., positioned around a point in space using a highprecision mechanical fixture). The reference point is used incalibration of the mechanical positioning system 170. In oneimplementation, the reference point is an isocenter 174 (e.g., geometricisocenter) of the mechanical positioning system 170 (e.g., isocenter 174of LINAC 150). In another implementation, the reference point is a knownoffset from the isocenter 174. The position of the isocenter 174 of themechanical positioning system 170 relative to the surface of the phantom120 will be known from design of the phantom 120 and the method ofmechanically positioning the phantom 120. In one implementation, thephantom 120 is mounted on a support 176.

The phantom 120 includes a phantom body 122. In one implementation, thephantom body 122 is hollow and the thickness and material of a hollowphantom body 122 allows transmission of backscattered exit surface image(see FIGS. 3D and 5B). The phantom 120 may have a transparency thatallows acquiring, using one camera system 110 at one location, of animage of an entrance feature 360 of a radiation beam 160 entering thephantom 120 and an exit feature 370 of the radiation beam 160 exitingthe phantom 120 (see FIG. 3D).

In another implementation, the phantom body 122 includes a substratethat is opaque (see FIG. 5D). The opaqueness of the phantom may notallow acquiring, using one camera system 110 at one location, of animage of an entrance feature 360 of a radiation beam 160 entering thephantom 120 and an exit feature 370 of the radiation beam exiting thephantom 120 (see FIG. 3D).

The phantom body 120 includes an X-ray luminescent material 124. In oneimplementation, the phantom body 122 is coated with an X-ray luminescentmaterial 124. In another implementation, the X-ray luminescent material124 is at least partially on the surface of the phantom body 122. Inanother implementation, the X-ray luminescent material 124 is at leastpartially embedded in the outer layer of the phantom body 122. Inanother implementation, the X-ray luminescent material 124 is integralto the material of the phantom body 122. For example, the phantom body122 may include a Terbium activated gadolinium oxysulphide (Gd₂O₂S₂)scintillator material 124. In one implementation, the X-ray luminescentmaterial 124 is an X-ray scintillation material with superficialbuild-up material. In another implementation, the X-ray luminescentmaterial 124 is an X-ray scintillation material without superficialbuild-up material. In another implementation, the X-ray luminescentmaterial 124 is a dielectric material (e.g., water, plastic, etc.) togenerate a Cerenkov optical signal in response to a radiation beam 160incident on the phantom 120. In one implementation, the dielectricmaterial is doped with a fluorescent compound (e.g., a wavelengthshifter) to enhance light emission at a plurality of angles (e.g., mostangles of the radiation beam 160 incident to the phantom 120) and toimprove detection sensitivity. In another implementation, the dielectricmaterial is not doped with fluorescent compound.

The surface of the phantom 120 is uniform. A relationship of opticalsignal (e.g., a measurement of a radiation beam incident to the surface)to absorbed dose (e.g., a measurement of absorption of the radiationbeam in the phantom) of the radiation beam 160 incident on the phantom120 is constant over the surface of the phantom 120. The phantom 120 mayinclude a pattern (e.g., checkerboard pattern, see FIG. 2C) of visuallyidentifiable features (e.g., squares of checkerboard pattern) atrelative positions overlaid on the X-ray luminescent material 124.

The phantom body 122 may be spherical (see FIG. 2A), cylindrical (seeFIG. 2B), cubical, conical, or another shape.

FIG. 2A illustrates a phantom 120A including a spherical phantom body122A that includes an X-ray luminescent material 124, in accordance withimplementations of the present disclosure. In one implementation, forcalibration of a mechanical positioning system 170 coupled to a LINAC150 that emits a radiation beam 160 that is non-coplanar, the phantombody 122A may be spherical and the phantom 120A is centered on theisocenter 174 of the mechanical positioning system 170 (e.g., isocenter174 of the LINAC 150).

FIG. 2B illustrates a phantom 120B including a cylindrical phantom body122B that includes an X-ray luminescent material 124, in accordance withimplementations of the present disclosure. In one implementation, forcalibration of a mechanical positioning system 170 coupled to a LINAC150 that emits a radiation beam 160 that is coplanar, the phantom body122B may be cylindrical (i.e., cylindrical phantom body 122B) andincludes a first circular end 210 and a second circular end 220 (notshown). A phantom axis 230 is aligned with a first center 212 of thefirst circular end 210 a second center 222 (not shown) of the secondcircular end 220. The phantom axis 230 is coincident with an axis ofrotation of the LINAC 150.

FIG. 2C illustrates a phantom 120A including a spherical phantom body122A that includes an X-ray luminescent material 124 and overlaid with apattern 200, in accordance with implementations of the presentdisclosure. The pattern 200 is an optical calibration object containingvisually identifiable features at known relative positions (e.g., acheckerboard pattern) that is overlaid on the X-ray luminescent material124 on the outer surface of the phantom body 122. In one implementation,the pattern 200 is used for calculating the pose of the camera withrespect to the beam axis 306 of the radiation beam (see method 500 ofFIG. 5A and method 540 of FIG. 5C).

Although FIG. 2C illustrates pattern 200 overlaid on a spherical phantombody 122A, pattern 200 can be overlaid on any other shape of phantombody 122. Although a checkerboard pattern is illustrated in FIG. 2C,alternative types of patterns may be used.

FIGS. 3A and 3E illustrates a calibration system 100 coupled to a LINAC150, in accordance with implementations of the present disclosure. Thecalibration system 100 includes a camera system 110 and a phantom 120.The phantom 120 is radiated by a radiation beam 160 emitted by LINAC150. The LINAC 150 has a housing 302 coupled to a collimator 152. One ormore radiation beams 160 may be emitted from a distal end 310 of theLINAC 150 along one or more beam axes 306 to a target location 320. Inone implementation, the target location 320 is located in or on aphantom 120. In another implementation, the target location 320 islocated in or on a surface of a patient.

In one implementation, one or more of the beam axes 306 may besubstantially normal to the target location 320 (e.g., perpendicular tothe phantom surface 308 overlaying the target location, forming a ninetydegree beam incident angle 150 with the phantom surface 308). The one ormore radiation beams 160 may be emitted through collimation (e.g., anaperture between banks of leaves in the collimator 152, rectangularvariable collimation, circular variable collimation, fixed collimation(e.g., cones), etc.).

In one implementation, the distal end 310 of the housing 302 of LINAC150 may be the radiation source 304. In another implementation, a distalend 310 of the housing 302 of LINAC 150 may be the area proximate wherethe housing 302 is coupled to the collimator 152. In anotherimplementation, a distal end 310 of the housing 302 of LINAC 150 may bethe area proximate where the radiation beam 160 is emitted from thehousing 302. In another implementation, the distal end 310 of housing302 may be where a one or more cameras 110 are coupled to the housing302.

A source-to-axis distance (SAD) 330 is measured from the radiationsource 304 to the target location 320. One or more of the support 176 orLINAC 150 may be used to vary the SAD 330. In one implementation,support 176 is a stage that moves the phantom 120 relative to the LINAC150 to vary the SAD 330. In another implementation, the support 176 is acouch and motion of the couch alters the SAD 330. In anotherimplementation, support 176 is floor or a wall of a treatment room and arobotic manipulator (e.g., robotic arm 172 of FIG. 1) is used to varythe SAD 330.

In some implementations, the one or more cameras 110 may be coupled tothe housing 302 of LINAC 150 at locations that do not interfere with theremoval and attachment of the collimator 152. In one implementation,each camera of camera system 110 may be coupled to the housing 302 at adistal end 310 of the LINAC 150. In another implementation, each cameraof camera system 110 may include a lens 312 disposed at a distal end 310of the LINAC 150 proximate exit of the radiation beam 160 from thecollimator 152 (e.g., exit surface 311) at a location that does notinterfere with removal and attachment of the collimator 152. Each lens312 may be shielded from the one or more radiation beams 160 by thecollimator 152. Each camera of camera system 110 may capture a set ofimages (e.g., live images) of the radiation beam 160 incident to thephantom 120 (e.g., optical Cerenkov emission generated at the phantom120 by charged particles of the radiation beam 160 moving in a medium ofthe phantom 120 with a phase speed greater than the speed of light inthe medium).

As shown in FIG. 3E, in some implementations, the one or more cameras110 may be positioned at an angle (e.g., 90 degrees) relative to thebeam axis 306. The one or more cameras 110 may be disposed proximate thedistal end 310 of housing 302. In one implementation, the one or morecameras 110 are coupled to the housing 302. In another implementation,the one or more cameras 110 are not coupled to the housing. In someimplementations, the camera system 110 and the radiation beam 160 havein-line geometry along the beam axis 306. The in-line geometry (e.g.,shared axis) may be achieved using a mirror 392. The mirror 392 may bein the beam path of the radiation beam 160. The camera system 110 may bedisposed at an angle (e.g., 90 degrees) relative to the beam axis 306and a mirror 392 (e.g., a 45-degree mirror) may be used to align theoptical axis and the beam axis 306. The mirror 392 may be calibrated(e.g., a one-time calibration) to provide aligning of the optical axisand the beam axis 306.

In one implementation, an image of the radiation beam 160 incident onthe phantom 120 may be acquired with a phantom 120 including ascintillator material (e.g., a Terbium activated Gd₂O₂S₂ scintillatormaterial) at least partially on the surface of the phantom 120, using 5monitor units (MUs) (a measure of machine output from a LINAC 150) witha 6× radiation beam 160 (e.g., photon beam produced by the accelerationof electrons to 6 megaelectron-volts (MeV)) at approximately 1000millimeter (mm) SAD 330, and with no build-up. This may result inapproximately 0.5 seconds per image acquisition and allowing anadditional 2.5 seconds for optical image acquisitioning and processing.This is approximately ten times faster than other calibration andverification methods (excluding robot motion time). In anotherimplementation, perspective correction is used, resulting in 30 minutesof perspective calibration followed by 100 nodes at 3 seconds per nodefor calibration, followed by verification, so the total time with themethods disclosed herein would be 40 minutes (excluding robot traversal)instead of 100 minutes with the other calibration and verificationmethods. For calibration and verification of 1,000 nodes (e.g., for adynamic treatment delivery method of delivering radiation beams from acontinuous range of beam source locations around the patient), the samecomparison becomes approximately 2 hours by the methods disclosed hereininstead of 17 hours by other methods.

FIG. 3B illustrates incidence of the radiation beam 160 on the phantom120 compared to view of a camera system 110, in accordance withimplementations of the present disclosure.

The LINAC 150 emits a radiation beam 160 from the radiation source 304to the target location 320 in or on the phantom 120. The camera system110 acquires an image of the radiation beam 160 incident on the phantom120 at the phantom surface (e.g., radiation pattern 352 on entrancesurface in FIG. 3C). Camera system 110 has a camera axis 314 (e.g.,center of lens 312 of camera 110, center of the image acquired by thecamera, center of the projection plane 316, etc.) and radiation beam 160has a beam axis 306 (e.g., center of the radiation beam 160). In oneimplementation, the camera axis 314 and beam axis 306 may both intersectthe phantom 120 at the target location 320 (e.g., at the center of thephantom 120).

The camera 110 is not coincident with the beam axis 306 of radiationbeam 160. The camera system 110 has a camera pose including translation(e.g., distance 318 between camera axis 314 and beam axis 306) androtation (e.g., angle of camera axis 314 in relation to beam axis 306).The distance 318 between a camera axis 314 of the camera system 110 andthe beam axis 306 results in a shift between the phantom centroid 354 ofthe phantom 120 and the pattern centroid 356 of a radiation pattern 352(e.g., radiation scintillation pattern) in images acquired by camerasystem 110 (see image 350 of FIG. 3C). A projection plane 316 is a viewof the camera system 110 of the phantom 120 and a radiation pattern 352the phantom surface 308. The projection plane 316 corresponds with animage 350 acquired by camera system 110 (see FIG. 3C).

FIG. 3C illustrates the view of a camera system 110 of a radiationpattern 352 from the incidence of the radiation beam 160 on the phantom120, in accordance with implementations of the present disclosure. Image350 is an image of the phantom 120 and radiation pattern 352 as acquiredby camera system 110. The phantom centroid 354 of the phantom 120 (e.g.,center of a spherical phantom) and the pattern centroid 356 of theradiation pattern 352 in image 350 do not coincide because of thedistance 318 and angle between the beam axis 306 and the camera axis314, and the finite size of the phantom. The offset between the phantomcentroid 354 and the pattern centroid 356 can be modeled based on thecamera pose (e.g., translation and rotation of camera system 110)relative to the phantom 120.

FIG. 3D illustrates radiation luminescence generated at an entrancesurface and an exit surface of the phantom 120, in accordance withimplementations of the present disclosure.

In one implementation, the phantom 120 may be constructed so that bothentrance feature 360 and exit feature 370 are visible in the sameprojection (e.g., projection plane 316, each of the first set of imagesis of an entrance surface and an exit surface of the phantom 120, etc.).For example, a camera system 110 may acquire an image of the phantom120, where the image displays both the entrance feature 360 and the exitfeature 370. The thickness and material of the phantom 120 allowtransmission of backscattered exit surface image. In one implementation,the entrance feature 360 and the exit feature 370 are separated in animage by the dimensions of the phantom 120 being greater than a firstthreshold size and the radiation beam 160 being less than a secondthreshold size. The material and thickness of the phantom 120 mayseparate the entrance feature 360 and exit feature 370 by opticalintensity.

In another implementation, two or more images are acquired by one ormore cameras of camera system 110 in different locations (e.g., a camera110 in a first location and a second location, or a first camera 110 ina first location and a second camera in a second location). In oneimplementation, the position of the entrance feature 360 or exit feature370 of the phantom 120 relative to the array of cameras 110 istriangulated using a first orientation of a first image from a firstcamera 110 and a second orientation of a second image from a secondcamera. The position of the entrance feature 360 or exit feature 370relative to the radiation beam 160 may be triangulated using a firstorientation of a first image from a first camera 110 and a secondorientation of a second image from a second camera. The phantom 120 maybe an opaque substrate.

One or more images (or views via camera 110) of the phantom 120 may beof the radiation beam 160 incident on the entrance surface and exitsurface of the phantom 120. The radiation beam 160 incident on theentrance surface of the phantom 120 generates an entrance feature 360(e.g., a teardrop shape) and the radiation beam 160 incident on the exitsurface of the phantom 120 (e.g., exiting the phantom 120) generates anexit feature 370 (e.g., a teardrop shape). The entrance feature 360 hasa first centroid 362 and the exit feature 370 has a second centroid 372.The first centroid 362 and the second centroid 372 create a line 380through the phantom and the line 380 has a half-way point 382. Adistance between the half-way point 382 and the center 384 of thephantom 120 is the beam pointing offset 390.

In one implementation, the center 384 of the phantom 120 may be aprojected isocenter of the LINAC 150 based on first images of thephantom 120 while the phantom 120 is not being irradiated, geometry ofthe phantom 120, and position of the phantom 120. The half-way point 382between the first centroid 362 and the second centroid 372 is based onsecond images of the phantom 120 while the radiation beam 160 isincident on the phantom 120. The lighting may be turned off or dimmedduring the acquisition of images of the phantom 120 with the phantom isbeing irradiated and the lighting may be turned on during theacquisition of images of the phantom 120 while the phantom 120 is notbeing irradiated.

In one implementation, lighting is constant (e.g., one room lightingstate for the whole procedure) and a camera system 110 captures oneimage that includes both the outline of the phantom 120 and thescintillation or Cerenkov signal. A beam pointing offset is determinedfrom the image and a position of the radiation source (e.g., LINAC 150)is calibrated based on the beam pointing offset.

In one implementation, using one or more cameras of camera system 110coupled to the LINAC 150, images are acquired of an entrance feature 360and no exit feature 370 (see FIG. 5A). In another implementation, usingone or more cameras of camera system 110 coupled to the LINAC 150,images are acquired of an entrance feature 360 and an exit feature 370(see FIG. 5B). In another implementation, using camera system 110located in static positions, images are acquired of an entrance feature360 and no exit feature 370 (see FIG. 5C). In another implementation,using camera system 110 located in static positions, images are acquiredof an entrance feature 360 and an exit feature 370 (see FIG. 5D).

FIGS. 4-5D illustrate flow diagrams of methods 400, 500, 520, 540, and560 for calibration of a position of a LINAC 150, in accordance withimplementations of the present disclosure. FIG. 6 illustrates a flowdiagram of method 600 for verification of a position of a LINAC 150, inaccordance with implementations of the present disclosure. Methods 400,500, 520, 540, 560, and 600 are described in relation to the calibrationor verification of a position of a LINAC 150. However, it should beunderstood that methods 400, 500, 520, 540, 560, and 600 may also beused to calibrate or verify a position of other systems that emitradiation, in particular, a radiation beam 160. The methods 400, 500,520, 540, 560, and 600 may be performed by processing logic thatcomprises hardware (e.g., circuitry, dedicated logic, programmablelogic, microcode, etc.), software (e.g., instructions run on aprocessing device to perform hardware simulation), or a combinationthereof.

In one implementation, prior to any of the methods in FIGS. 4-5D,intrinsic properties (e.g., intrinsic camera properties, sensordistortions, lens distortions, etc.) of the one or more cameras ofcamera system 110 are determined. This is a one-off procedure that maybe performed prior to installation of the one or more cameras of camerasystem 110 (e.g., prior to coupling one or more cameras 110 to the LINAC150, prior to locating the cameras of camera system 110 in stationarylocations relative to the phantom 120, etc.). Corrections for thedistortions in the intrinsic properties of the camera system 110 areapplied to all images described in FIGS. 4-5D. For example, theprocessing device applies corrections for the sensor and lensdistortions to the first set of images and the second set of images.

FIG. 4 illustrates a flow diagram of a method 400 for calibration of aposition of a LINAC 150, in accordance with implementations of thepresent disclosure.

At block 410, processing logic acquires, using a camera system 110, animage of a radiation beam 160 incident on a phantom 120. In oneimplementation, block 410 includes acquiring, using one or more camerasof camera system 110, a first set of images of a phantom 120 while thephantom 120 is not being irradiated and acquiring, using one or morecameras of camera system 110, a second set of images of a radiation beam160 incident on the phantom. The phantom 120 includes an X-rayluminescent material 124 at least partially on the surface of thephantom body 122. The radiation beam 160 is emitted by a radiationsource (e.g., a LINAC 150).

At block 420, processing logic determines a beam pointing offset basedon the image. In one implementation, block 410 includes determining thebeam pointing offset based on the first set of images and the second setof images.

At block 440, processing logic calibrates a position of the LINAC 150based on the beam pointing offset. In some implementations, the beampointing error from block 630 of FIG. 6 may be applied as a beampointing offset to mechanical beam positioning devices (e.g., devices ofmechanical positioning system 170) to adjust the position of the LINAC150. The calibration method of any one of methods 400, 500, 520, 540, or560 and the verification method of method 600 may be iterated. A list ofbeam pointing offsets that can be applied by the mechanical positioningsystems during treatment (e.g., used to amend or replace the existingpointing calibration) may be output (e.g., as a report).

Blocks 410-440 may be repeated (e.g., after block 440, the method 400may restart at 410) if a set of a radiation beams is to be calibrated.

FIGS. 5A-D illustrate flow diagrams for calibration of a position of aradiation source using one or more cameras of camera system 110 coupledto the radiation source. In one implementation, the methods of FIGS.5A-D include one camera of system 110 acquiring one image of theradiation beam incident on the phantom 120, a beam pointing offset beingdetermined based on the image, and the position of the radiation sourcebeing calibrated based on the beam pointing offset. In anotherimplementation, the methods of FIGS. 5A-D include one or more camerasacquiring a plurality of images of the radiation beam incident on thephantom 120, a beam pointing offset being determined based on theplurality of images, and the position of the radiation source beingcalibrated based on the beam pointing offset.

FIG. 5A illustrates a flow diagram of a method 500 for calibration of aposition of a LINAC 150 using one or more cameras of camera system 110coupled to the LINAC 150 to acquire images of an entrance surface of thephantom 120, in accordance with implementations of the presentdisclosure.

At block 508, processing logic acquires, using one or more cameras ofcamera system 110, a first set of images of a phantom while the phantom120 is not being irradiated. The phantom 120 may be mounted at theisocenter 174 of the mechanical positioning system 170 (e.g., isocenter174 of the LINAC 150).

At block 510, processing logic acquires, using the one or more camerasof camera system 110, a second set of images of the radiation beam 160incident on the phantom. The second set of images may be of theradiation beam 160 incident on a portion of the phantom surface 308 ofphantom 120 that is most proximate to the radiation source 304 (e.g.,the entrance feature 360). The radiation beam 160 is collimated to besymmetric about the beam axis 306 (e.g., using a fixed circularcollimator).

At block 512, processing logic determines a projected isocenter of theradiation source (e.g., LINAC 150) based on the first set of images,geometry of the phantom 120, and position of the phantom 120. Forexample, for a phantom 120A with a spherical phantom body 122A that issurrounding the isocenter 174 of the mechanical positioning system 170,the projected isocenter (e.g., phantom centroid 354) is the center 384of the circular outline of the phantom 120A.

At block 514, processing logic determines a third centroid of theradiation beam 160 incident on the phantom 120 (e.g., pattern centroid356) based on the second set of images.

At block 516, processing logic determines a beam pointing offset basedon comparing the projected isocenter and the third centroid. Theprocessing logic determines a direction of the beam pointing offset. Inone implementation, the direction is found by an iterative search. Therobot pointing is adjusted by the offset magnitude (e.g., the targetinglocation 320 is shifted by the magnitude of the beam pointing offset andthe location of the radiation source 304 is not adjusted) and the beampointing offset is applied in a random direction or is guided by theshape of the projected beam aperture onto the phantom surface 308 (e.g.,for a circular radiation beam 160 projected onto a spherical phantombody 122A, the beam pointing offset should be applied along the majoraxis of the projected shape, in the direction of the fat end of the teardrop shape (entrance feature 360)). In another implementation, thedirection is found by optical fiducial marks placed on the surface ofthe phantom 120 from which the orientation of the phantom 120 in roomspace can be calculated in each optical image which allows the directionof the beam pointing offset to be calculated as well as the magnitude.In another implementation, the direction is found by camera extrinsicparameters (e.g., pose of the camera 110) that describe the orientationof the image relative to the radiation beam 160 and if the nominalorientation of the radiation beam 160 with respect to the room is alsoknown, then the camera extrinsic parameters and the nominal orientationof the radiation beam 160 can be combined to give the offset direction.

At block 518, processing logic calibrates a position of the LINAC basedon the beam pointing offset and the relationship. In one implementation,the calibrating the position of the LINAC 150 may be by storing the beampointing offset for later use. In another implementation, thecalibrating the position of the LINAC 150 may be by adjusting theposition of the LINAC 150 via the mechanical positioning system 170.

In some implementations, the beam pointing error from block 630 of FIG.6 may be applied as a beam pointing offset to mechanical beampositioning devices (e.g., devices of mechanical positioning system 170)to adjust the position of the LINAC 150. The calibration method of anyone of methods 400, 500, 520, 540, or 560 and the verification method ofmethod 600 may be iterated. A list of beam pointing offsets that can beapplied by the mechanical positioning systems during treatment (e.g.,used to amend or replace the existing pointing calibration) may beoutput (e.g., as a report).

Blocks 508-518 may be repeated (e.g., after block 518, the method 500may restart at 508) if a set of a radiation beams is to be calibrated.

In one implementation, the one or more cameras of camera system 110 arein-line with the beam axis of the radiation beam 160. In anotherimplementation, the one or more cameras are not in-line with a beam axisof the radiation beam and the method further includes calculating poseof the one or more cameras of camera system 110 with respect to theradiation beam axis (e.g., blocks 502-506, not shown in FIG. 5A). Atblock 502, processing logic acquires, using the one or more cameras ofcamera system 110, a third set of images of a pattern 200 (see FIG. 2C)overlaid on the X-ray luminescent material 124 while the phantom 120 isnot being irradiated. The third set of images is acquired at one or moreSAD 330. The one or more SAD 330 may be provided by phantom 120 beingmounted on support 176 and the support 176 or LINAC 150 moving relativeto each other. Processing logic determines pose (e.g., translation androtation of camera axis 314 relative to beam axis 306) and focal lengthof the one or more cameras of camera system 110 from the third set ofimages of pattern 200.

At block 504, processing logic acquires, using the one or more cameras,a fourth set of images of the radiation beam incident on the pattern atone or more SAD 330 (see FIG. 3A). Processing logic determines alocation of the beam axis 306 with respect to the pattern 200 from thefourth set of images. One or more SAD 330 in block 504 may correspondwith the one or more SAD in block 502. Each of the third set of imagescorresponds to one or more images of the fourth set of images.

At block 506, processing logic determines, based on the pose, the focallength, and the location of the beam axis, a relationship between afirst centroid of the phantom 120 (e.g., phantom centroid 354 of FIG.3C) and a second centroid of the radiation beam 160 (e.g., patterncentroid 356 of FIG. 3C) incident on the pattern 200 (e.g.,scintillation pattern as seen by the camera). Since the camera axis 314is not coincident with the beam axis 306, an image 350 of phantom 120and the radiation pattern 352 will not be concentric even when theradiation beam 160 is pointing exactly at the center of the phantom 120(e.g., phantom centroid 354). In one implementation, the relationshipdetermined by block 506 may be an expected offset (e.g., distancebetween phantom centroid 354 and pattern centroid 356 of FIG. 3C) andmay be used as a goal (e.g., target value) during determining of thebeam pointing offset. In another implementation, the relationshipdetermined by block 506 may be an expected offset (e.g., distancebetween phantom centroid 354 and pattern centroid 356) may be convertedinto a beam pointing offset such that the phantom 120 and radiationpatterns 352 become concentric in the image 350 acquired by camerasystem 110 by application of the beam pointing offset.

In one implementation, blocks 502-506 may be a camera calibration setupthat is a one-off procedure (if pose is repeatable). In anotherimplementation, blocks 502-506 may be required before each calibrationprocedure (e.g., blocks 508-518) or verification procedure (e.g., method600) is performed. In one implementation, blocks 502-506 may begeneralized to multiple camera configurations and the accuracy of thecalibration may improve with multiple cameras for camera system 110.

FIG. 5B illustrates a flow diagram of a method 520 for calibration of aposition of a LINAC 150 using one or more cameras of camera system 110coupled to the LINAC 150 to acquire images of an entrance surface and anexit surface of the phantom 120, in accordance with implementations ofthe present disclosure.

Method 520 does not require pose information of the camera system 110(e.g., does not require blocks 502-506 of method 500).

At block 522, processing logic acquires, using one or more cameras ofsystem 110, a first set of images of a phantom 120 while the phantom 120is not being irradiated.

At block 524, processing logic acquires, using the one or more camerasof system 110, a second set of images of a radiation beam 160 incidenton the phantom 120. Each of the second set of images is of the radiationbeam incident on an entrance surface and an exit surface of the phantom(e.g., display both entrance feature 360 and exit feature 370 (see FIG.3D)). In one implementation, the phantom 120 used in method 500 may beconstructed so that both entrance feature 360 and exit feature 370 arevisible in the same projection (e.g., projection plane 316, each of thefirst set of images is of an entrance surface and an exit surface of thephantom 120, etc.). In another implementation, two or more of the firstset of images are a super-position of an entrance surface and an exitsurface of the phantom 120. The thickness and material of the phantom120 allow transmission of backscattered exit surface image. In oneimplementation, the entrance feature 360 and the exit feature 370 areseparated in an image by the phantom 120 having a first size greaterthan a first threshold size and the radiation beam 160 having a secondsize less than a second threshold size. The material and thickness ofthe phantom 120 may separate the entrance feature 360 and exit feature370 by optical intensity.

At block 526, processing logic determines a projected isocenter of theLINAC 150 onto an image plane based on the first set of images, geometryof the phantom, and position of the phantom. The projected isocenter ofthe LINAC 150 may be coincident with the center of the phantom. Theprojected isocenter of the LINAC 150 may be a property of the treatmentdevice as a whole and not of each individual radiation beam 160. Forexample, the projected isocenter may be the center 384 of phantom 120that has a spherical phantom body 122A (see FIG. 3D).

At block 528, processing logic determines a half-way point 382 between afirst centroid 362 of the radiation beam 160 incident on the entrancesurface (e.g., entrance feature 360) and a second centroid 372 of theradiation beam 160 incident on the exit surface (e.g., exit feature 370)based on the second set of images.

At block 530, processing logic determines a beam pointing offset 390based on a distance between the projected isocenter (e.g., center 384 ofphantom 120) and the half-way point 382.

In one implementation, the direction of the beam pointing offset 390 maybe determined by an iterative search as described above. In anotherimplementation, the direction of the beam pointing offset 390 may bedetermined by optical fiducial marks placed on the surface of thephantom 120 as described above.

At block 532, processing logic calibrates a position of the LINAC 150based on the beam pointing offset.

Blocks 522-532 may be repeated (e.g., after block 532, the method 520may restart at 522) if a set of a radiation beams is to be calibrated.

FIG. 5C illustrates a flow diagram of a method 540 for calibration of aposition of a LINAC 150 using cameras of camera system 110 positioned atstatic locations to acquire images of an entrance surface of the phantom120, in accordance with implementations of the present disclosure.

At block 550, processing logic acquires, using one or more cameras ofsystem 110, a first set of images of a phantom 120 while the phantom 120is not being irradiated. In one implementation, the phantom 120 islocated about the isocenter 174 of mechanical positioning system 170.

At block 552, processing logic acquires, using the one or more camerasof camera system 110, a second set of images of a radiation beam 160incident on the phantom 120. The second set of images is of radiationbeam 160 incident on the entrance surface of the phantom 120.

At block 554, processing logic determines a center, triangulated in 3D,of the radiation beam 160 incident on the phantom 120 (e.g., patterncentroid 356) based on the second set of images.

At block 556, processing logic determines a beam pointing offset basedon the center triangulated in 3D and a location of a source of theradiation beam 160 (e.g., radiation source 304, node of LINAC, spatiallocation in a room).

At block 558, processing logic calibrates a position of the LINAC 150based on the beam pointing offset and the relationship (from block 548).In one implementation, a beam vector is determined based on centertriangulated in 3D and the location of the radiation source 304. Thebeam pointing offset magnitude and direction are determined from thebeam vector.

Blocks 550-558 may be repeated (e.g., after block 558, the method 540may restart at 550) if a set of a radiation beams is to be calibrated.

In one implementation, the one or more cameras of camera system 110 arein-line with the beam axis of the radiation beam 160. In anotherimplementation, the one or more cameras are not in-line with a beam axisof the radiation beam and the method further includes calculating poseof the one or more cameras of camera system 110 with respect to theradiation beam axis (e.g., blocks 540-548, not shown in FIG. 5C). Atblock 542, processing logic acquires, using the plurality of cameras, athird set of images of a pattern 200 overlaid on the X-ray luminescentmaterial while the phantom 120 is not being irradiated to determine poseand focal length of the plurality of cameras of camera system 110. Theplurality of cameras of camera system 110 is an array of cameras fixedwithin a room (e.g., a treatment room). A threshold number of cameras ofcamera system 110 are needed such that the phantom 120 and radiationpattern 352 at the entrance surface of the phantom 120 are visible onmultiple cameras of camera system 110 with each direction of theradiation beam 160. The third set of images may be at a plurality of SADbetween the pattern 200 and the LINAC 150.

At block 544, processing logic maps the third set of images tostationary spatial camera positions of the plurality of cameras ofcamera system 110 to perform a three-dimensional (3D) calibration. The3D calibration is based on multiple optical checkerboard positions andorientations (e.g., images from a plurality of cameras of camera system110 at a plurality of SAD). Each camera of camera system 110 of theplurality of cameras of camera system 110 is mapped to a correspondingspatial position.

At block 546, processing logic acquires, using the plurality of camerasof camera system 110, a fourth set of images of the radiation beam 160incident on the pattern 200 at a plurality of SAD to determine alocation of a beam axis 306 with respect to the pattern 200.

At block 548, processing logic determines, based on the pose, the focallength, and the location of the beam axis 306, a relationship between afirst centroid 354 of the phantom 120 and a second centroid 356 of theradiation beam 160 incident on the pattern 200. In one implementation,blocks 542-548 may be a one-off procedure if the cameras remain staticbetween tests.

In one implementation, blocks 540-548 may be a camera calibration setupthat is a one-off procedure (if pose is repeatable). In anotherimplementation, blocks 540-548 may be required before each calibrationprocedure (e.g., blocks 550-558) or verification procedure (e.g., method600) is performed. In one implementation, blocks 502-506 may begeneralized to multiple camera configurations and the accuracy of thecalibration may improve with multiple cameras 110.

FIG. 5D illustrates a flow diagram of a method 560 for calibration of aposition of a LINAC 150 using camera system 110 located at staticlocations to acquire images of an entrance surface and an exit surfaceof the phantom 120, in accordance with implementations of the presentdisclosure.

At block 562, processing logic acquires, using a plurality of cameras ofcamera system 110, a first set of images of a phantom 120 while thephantom 120 is not being irradiated. In one implementation, the phantom120 of method 560 may be substrate that is opaque. In oneimplementation, one or more of the plurality of cameras of camera system110 acquires an image of the unirradiated entrance surface. The image ofthe unirradiated entrance surface may further display the light signalat the exit surface. In another implementation, the plurality of camerasof camera system 110 acquires an image of the unirradiated entrancesurface and an image of the unirradiated exit surface.

At block 564, processing logic acquires, using the one or more camerasof camera system 110, a second set of images of a radiation beam 160incident on the phantom 120. Two or more of the second set of images maybe used to generate a super-position of the radiation beam 160 incidenton an entrance surface (e.g., entrance feature 360) and an exit surface(e.g., exit feature 370) of the phantom 120.

At block 566, processing logic determines a projected isocenter of theradiation source (e.g., LINAC 150) based on the first set of images,geometry of the phantom 120, and position of the phantom 120.

At block 568, processing logic determines a first center, triangulatedin 3D, of the radiation beam 160 incident on the entrance surface (e.g.,entrance feature 360) and a second center, triangulated in 3D, of theradiation beam incident on the exit surface (e.g., exit feature 370)based on the second set of images.

At block 570, processing logic determines a beam pointing offset basedon the first center triangulated in 3D, the second center triangulatedin 3D, and the projected isocenter. In one implementation, a beam vectoris determined from the first center and the first center without thelocation of the radiation source 304. The beam vector and projectedisocenter are used to determine the beam pointing offset.

At block 572, processing logic calibrates a position of the LINAC 150based on the beam pointing offset. In some implementations, the beampointing error from block 630 of FIG. 6 may be applied as a beampointing offset to mechanical beam positioning devices (e.g., devices ofmechanical positioning system 170) to adjust the position of the LINAC150. The calibration method of any one of methods 400, 500, 520, 540, or560 and the verification method of method 600 may be iterated. A list ofbeam pointing offsets that can be applied by the mechanical positioningsystems during treatment (e.g., used to amend or replace the existingpointing calibration) may be output (e.g., as a report).

Blocks 562-572 may be repeated (e.g., after block 572, the method 560may restart at 562) if a set of a radiation beams is to be calibrated.

It should be noted that the above described operations are just onemethod of calibrating a position of a LINAC 150 and that, in alternativeimplementations, certain ones of the operations of FIG. 4-5D may beoptional or take a simpler form.

FIG. 6 illustrates a flow diagram of a method 600 for verification of aposition of a LINAC 150, in accordance with implementations of thepresent disclosure. In some implementations, method 600 may occur afterany one of methods 400, 500, 520, 540, or 560. In some implementations,method 600 may occur without any of methods 400, 500, 520, 540, or 560.Method 600 may occur after a different method for calibration (e.g., aslower method of calibration, a calibration technique using a pointdetector and a raster scan). Method 600 may be iterated.

At block 610, processing logic acquires, using a camera of camera system110 of the one or more cameras of camera system 110, a third image ofthe radiation beam 160 incident on the phantom 120 subsequent to thecalibrating of the position of the LINAC 150. The calibrating of theposition of the LINAC 150 may include updating the offsets used by themechanical positioning system 170 in positioning the LINAC 150 foremitting of a radiation beam 160.

At block 620, processing logic calculates a beam pointing error based onthe third image and a corresponding image of the second set of images.The second set of images may be of the radiation beam 160 incident onthe phantom 120 acquired in any one of methods 400, 500, 520, 540, or560.

At block 630, processing logic outputs the beam pointing error. The beampointing error may be output as a list of verification resultsdescribing the resulting beam pointing error at each position after thefinal calibration (e.g., the final calibration after any iterations ofcalibration) is applied. If only a verification procedure is performed(e.g., as part of system Quality Assurance), then only a report of theverification results may be generated.

Blocks 610-630 may be repeated (e.g., after block 630, the method 600may restart at 610) if a set of positions (e.g., positions of the LINACfor emitting radiation beams) is to be verified.

It should be noted that the above described operations are just onemethod of verifying a position of a LINAC 150 and that, in alternativeimplementations, certain ones of the operations of FIG. 6 may beoptional or take a simpler form.

The methods described in FIGS. 4-6 may be used in systems other than aradiation beam 160 incident on a phantom 120.

FIG. 7 illustrates systems that may be used in performing radiationtreatment, in accordance with implementations of the present disclosure.These systems may be used to perform, for example, the methods describedabove. As described below and illustrated in FIG. 7, a system 700 mayinclude a calibration system 100 and a treatment delivery system 715.

In one implementation, calibration system 100 includes an imagingdetector 730 (e.g., one or more cameras of camera system 110) to acquirea first set of images of a phantom 120 without being irradiated and asecond set of images of a radiation beam 160 incident on the phantom120.

In one implementation, imaging detector 730 may be coupled to processingdevice 740 to control the imaging operation and process image data. Inone implementation, calibration system 100 may receive imaging commandsfrom treatment delivery system 715.

Calibration system 100 includes a processing device 740 to calibrate theposition of the LINAC 150. Processing device 740 may represent one ormore general-purpose processors (e.g., a microprocessor), specialpurpose processor such as a digital signal processor (DSP) or other typeof device such as a controller or field programmable gate array (FPGA).Processing device 740 may be configured to execute instructions forperforming beam profile measurement generating operations discussedherein. Processing device 740 may also include other components (notshown) such as memory, storage devices, network adapters and the like.Processing device 740 may be configured to generate digital diagnosticimages in a standard format, such as the Digital Imaging andCommunications in Medicine (DICOM) format, for example. In otherimplementations, processing device 740 may generate other standard ornon-standard digital image formats. Processing device 740 may transmitdiagnostic image files (e.g., the aforementioned DICOM formatted files)to treatment delivery system 715 over a data link 790, which may be, forexample, a direct link, a local area network (LAN) link or a wide areanetwork (WAN) link such as the Internet. In addition, the informationtransferred between systems may either be pulled or pushed across thecommunication medium connecting the systems, such as in a remotediagnosis or treatment planning configuration. In remote diagnosis ortreatment planning, a user may utilize implementations of the presentdisclosure to diagnose or treat a patient despite the existence of aphysical separation between the system user and the patient.

Calibration system 100 may also include system memory 735 that mayinclude a random access memory (RAM), or other dynamic storage devices,coupled to processing device 740 by bus 786, for storing information andinstructions to be executed by processing device 740. System memory 735also may be used for storing temporary variables or other intermediateinformation during execution of instructions by processing device 740.System memory 735 may also include at least one of a read only memory(ROM) or other static storage device coupled to bus 786 for storingstatic information and instructions for processing device 740.

Calibration system 100 may also include storage device 745, representingone or more storage devices (e.g., a magnetic disk drive or optical diskdrive) coupled to bus 786 for storing information and instructions.Storage device 745 may be used for storing instructions for performingthe beam profile measurement steps discussed herein.

Processing device 740 may also be coupled to a display device 750, suchas a cathode ray tube (CRT) or liquid crystal display (LCD), fordisplaying information (e.g., beam profile offset of FIGS. 4-6, beamprofile error of FIG. 6, etc.) to the user. An input device 755, such asa keyboard, may be coupled to processing device 740 for communicating atleast one of information or command selections to processing device 740.One or more other user input devices (e.g., a mouse, a trackball orcursor direction keys) may also be used to communicate directionalinformation, to select commands for processing device 740 and to controlcursor movements on display 750. Processing device 740 may be coupled tosystem memory 735, storage device 745, display device 750, and inputdevice 755 by a bus 786 or other type of control and communicationinterface.

In one implementation, the input device 755 may receive input from auser to perform one or more of calibration or verification of a positionof a LINAC 150 (e.g., one or more of calibration or verification of themechanical positioning system 170 coupled to the LINAC 150, etc.). Theprocessing device 740 may transmit a first command to the one or morecameras of camera system 110 to acquire a first set of images of phantom120 while the phantom is not being irradiated, transmit a second commandto emit a radiation beam 160 using the LINAC 150, transmit a thirdcommand to the one or more cameras of camera system 110 to acquire asecond set of images of a radiation beam 160 incident on the phantom120, determine a beam pointing offset based on the first set of imagesand the second set of images, and transmit a fourth command to calibratea position of the LINAC 150 based on the beam pointing offset. Theprocessing device 740 may generate a list of beam pointing offsets and alist of beam pointing errors to be displayed via display device 750.

Calibration system 100 may share its database (e.g., data stored instorage 745) with a treatment delivery system, such as treatmentdelivery system 715, so that it may not be necessary to export from thetreatment planning system prior to treatment delivery. Calibrationsystem 100 may be linked to treatment delivery system 715 via a datalink 790, which in one implementation may be a direct link, a LAN linkor a WAN link.

In one implementation, treatment delivery system 715 includes one ormore of a therapeutic or surgical radiation source 304 (e.g., LINAC 150)to administer a prescribed radiation dose (e.g., radiation beam 160) toa target volume (e.g., patient, phantom 120, etc.). Treatment deliverysystem 715 may also include imaging system 765 to perform computedtomography (CT) such as cone beam CT, and images generated by imagingsystem 765 may be two-dimensional (2D) or three-dimensional (3D).

Treatment delivery system 715 may also include a processing device 770to control radiation source 304, receive and process data fromcalibration system 100, and control a support device such as a support176. Processing device 770 may include one or more general-purposeprocessors (e.g., a microprocessor), a special purpose processor such asa digital signal processor (DSP) or other type of device such as acontroller or field programmable gate array (FPGA). The processingdevice 770 may be configured to execute instructions to position theLINAC 150 (e.g., via calibration of the mechanical positioning system170).

Treatment delivery system 715 also includes system memory such as arandom access memory (RAM), or other dynamic storage devices, coupled toa processing device, for storing information and instructions to beexecuted by the processing device. The system memory also may be usedfor storing temporary variables or other intermediate information duringexecution of instructions by the processing device 770 (e.g.,instructions received from calibration system 100) or processing device740. The system memory may also include one or more of a read onlymemory (ROM) or other static storage device for storing staticinformation and instructions for the processing device.

Treatment delivery system 715 also includes a storage device,representing one or more storage devices (e.g., a magnetic disk drive oroptical disk drive) for storing information and instructions (e.g.,instructions received from calibration system 100). Processing device770 may be coupled to radiation source 304 and support 176 by a bus 792or other type of control and communication interface.

Processing device 770 may implement methods to manage timing ofdiagnostic x-ray imaging in order to maintain alignment of a target witha radiation treatment beam delivered by the radiation source 304.Processing device 770 may implement methods to manage timing ofdiagnostic x-ray imaging in order to maintain alignment of a target witha set of radiation treatment beams delivered by the radiation source304.

In one implementation, the treatment delivery system 715 includes aninput device 778 and a display 777 connected with processing device 770via bus 792. The display 777 can show trend data that identifies a rateof target movement (e.g., a rate of movement of a target volume that isunder treatment). The display 777 can also show a current radiationexposure of a patient and a projected radiation exposure for thepatient. The input device 778 can enable a clinician to adjustparameters of a treatment delivery plan during treatment.

It should be noted that when data links 786 and 790 are implemented asLAN or WAN connections, at least one of calibration system 100 ortreatment delivery system 715 may be in decentralized locations suchthat the systems may be physically remote from each other.Alternatively, at least one of calibration system 100 or treatmentdelivery system 715 may be integrated with each other in one or moresystems.

FIG. 8 illustrates configurations of calibration system 800, inaccordance with implementations of the present disclosure. In oneimplementation, the calibration system 800 includes camera 110A coupledto a LINAC 150. In another implementation, the calibration system 800includes cameras 110B that are stationary. LINAC 150 acts as a radiationtreatment source. LINAC 150 is coupled to a mechanical positioningsystem 170 including a robotic arm 172. In one implementation, the LINAC150 and camera 110A are mounted on the end of a robotic arm 172 havingmultiple (e.g., 5 or more) degrees of freedom in order to position theLINAC 150 to irradiate a pathological anatomy (e.g., target location320) with radiation beams 160 delivered from many angles, in manyplanes, in an operating volume around a phantom 120, and to captureimages by the camera 110 of the radiation beam 160 incident on thephantom 120. Treatment may involve beam paths with a single isocenter,multiple isocenters, or with a non-isocentric approach. Alternatively,other types of image guided radiation treatment (IGRT) systems may beused. In one alternative implementation, the LINAC 150 and one or morecameras 110 may be mounted on a gantry based system (e.g., roboticgantry) to provide isocentric beam paths (see FIG. 9). In one particularimplementation, the IGRT system is the Vero SBRT System (referred to asTM200 in Japan), a joint product of Mitsubishi Heavy Industries Ltd., ofTokyo Japan and BrainLAB AG of Germany, that utilizes a rigid O-ringbased gantry (see FIG. 9).

In one implementation, the LINAC 150 and camera 110 may be positioned atmultiple different nodes (predefined positions at which the robot stopsand radiation may be delivered) during treatment by moving the roboticarm 172. At the nodes, the LINAC 150 can deliver one or more radiationbeams 160 to a target location 320. The nodes may be arranged in anapproximately spherical distribution about a phantom 120. The particularnumber of nodes and the number of radiation beams 160 applied at eachnode may vary as a function of the location and type of pathologicalanatomy to be treated. For example, the number of nodes may vary from 50to 300, or more preferably 15 to 100 nodes and the number of treatmentbeams 114 may vary from 700 to 3200, or more preferably 50 to 300. Inone implementation, there are at least 1000 nodes.

Referring to FIG. 8, calibration system 700, in accordance with oneimplementation of the present disclosure, includes fixed cameras 110Bcoupled to a processing device 670. Alternatively, the cameras 110B maybe mobile, in which case they may be repositioned to at least one ofmaintain alignment with the target location 320, image the targetlocation 320 from different orientations, or to acquire many images andreconstruct a three-dimensional (3D) cone-beam CT. In one implementationthe cameras 110 are not point cameras, but rather camera arrays, aswould be appreciated by the skilled artisan. In one implementation,LINAC 150 serves as an imaging source (whether gantry or robot mounted),where the LINAC power level is reduced to acceptable levels for imaging.

Calibration system 800 may perform computed tomography (CT) such as conebeam CT, and images generated by calibration system 800 may betwo-dimensional (2D) or three-dimensional (3D). The cameras 110B may bemounted in fixed positions on the ceiling of an operating room and maybe aligned to acquire images from two different angular positions (e.g.,separated by 90 degrees) to intersect at a machine isocenter (referredto herein as a treatment center, which provides a reference point forpositioning the phantom 120 on a support 176 during emitting ofradiation beams 160). In one implementation, calibration system 800provides stereoscopic imaging of the target location 320 and thesurrounding volume of interest (VOI). In other implementations,calibration system 800 may include more than cameras 110B, and any ofthe cameras 110B may be movable rather than fixed. Phantom 120 may befabricated from or coated with a scintillating material that convertsthe radiation beam 160 to visible light (e.g., amorphous silicon), andthe light may be converted to a digital image that can be compared witha reference image during an image registration process that transforms acoordinate system of the digital image to a coordinate system of thereference image, as is well known to the skilled artisan. The referenceimage may be, for example, a digitally reconstructed radiograph (DRR),which is a virtual x-ray image that is generated from a 3D CT imagebased on simulating the x-ray image formation process by casting raysthrough the CT image.

FIG. 9 illustrates a gantry based intensity modulated radiotherapy(IMRT) system 900, in accordance with implementations of the presentdisclosure. In one implementation, the LINAC 150 is mounted on a gantry903 (e.g., a mechanical positioning system 170). In a gantry basedsystem 900, a radiation source (e.g., a LINAC 150) having a headassembly 901 is mounted on a gantry 903 in such a way that they rotatein a plane corresponding to an axial slice of the phantom 120. Radiationbeams 160 are then delivered from several positions on the circularplane of rotation (e.g., around an axis of rotation). In oneimplementation, one or more cameras 110 may be coupled to the LINAC 150.In another implementation, cameras are statically located. In IMRT, thecamera 110 may acquire a first set of images of the phantom 120 withoutbeing irradiated and a second set of images of a radiation beam 160incident on the phantom 120. The images may be acquired at differentpositions of the LINAC 150. The resulting system generates arbitrarilyshaped radiation beams 160 that intersect each other at the isocenter todeliver a dose distribution to the target location. In oneimplementation, the gantry based system 900 may be a c-arm based system.

FIG. 10 illustrates a helical radiation delivery system 1000, inaccordance with implementations of the present disclosure. The helicalradiation delivery radiotherapy system 1000 includes a LINAC 150 mountedto a ring gantry 1020. The ring gantry 1020 has a toroidal shape and thetarget location 320 (e.g., phantom 120, a patient, etc.) is movedthrough a bore of the toroidal shape of the ring gantry 1020. A centralaxis passes through the center of the bore. In one implementation, aradiation beam 160 is generated by a LINAC 150 that is mounted to a ringgantry 1020 that rotates around the central axis to deliver theradiation beam 160 to a phantom 120 from various angles. While theradiation beams 160 are being delivered, the phantom 120 is on atreatment couch 1040 (e.g., an adjustable table, support 176) and thephantom 120 is simultaneously moved through the bore of the ring gantry1020 allowing horizontal movement of the radiation beam 160 in relationto the phantom 120 without horizontally moving the LINAC 150 or thephantom 120. The treatment couch 1040 may move the phantom in a verticaldirection so that images may be acquired at different SAD 330.

In some implementations, the LINAC 150 may be mounted to a C-arm gantryin a cantilever-like manner, which rotates the LINAC 150 about the axispassing through the isocenter of the ring gantry 1020. In otherimplementations, the LINAC 150 may be mounted to a robotic arm havingmultiple (e.g., 5 or more) degrees of freedom in order to position theLINAC 150 around the ring gantry 1020 to irradiate the phantom 120 thatis moved (e.g., horizontally, vertically) by the treatment couch 1040.

It will be apparent from the foregoing description that aspects of thepresent disclosure may be embodied, at least in part, in software. Thatis, the techniques may be carried out in a computer system or other dataprocessing system in response to a processing device 770, for example,executing sequences of instructions contained in a memory. In variousimplementations, hardware circuitry may be used in combination withsoftware instructions to implement the present disclosure. Thus, thetechniques are not limited to any specific combination of hardwarecircuitry and software or to any particular source for the instructionsexecuted by the data processing system. In addition, throughout thisdescription, various functions and operations may be described as beingperformed by or caused by software code to simplify description.However, those skilled in the art will recognize what is meant by suchexpressions is that the functions result from execution of the code byprocessing device 770.

A machine-readable medium can be used to store software and data whichwhen executed by a general purpose or special purpose data processingsystem causes the system to perform various methods of the presentdisclosure. This executable software and data may be stored in variousplaces including, for example, system memory and storage or any otherdevice that is capable of storing software programs and/or data. Thus, amachine-readable medium includes any mechanism that provides (i.e.,stores) information in a form accessible by a machine (e.g., a computer,network device, personal digital assistant, manufacturing tool, anydevice with a set of one or more processors, etc.). For example, amachine-readable medium includes recordable/non-recordable media such asread only memory (ROM), random access memory (RAM), magnetic diskstorage media, optical storage media, flash memory devices, etc. Themachine-readable medium may be a non-transitory computer readablestorage medium.

Unless stated otherwise as apparent from the foregoing discussion, itwill be appreciated that terms such as “acquiring,” “determining,”“calibrating,” “mapping,” “outputting,” “applying,” or the like mayrefer to the actions and processes of a computer system, or similarelectronic computing device, that manipulates and transforms datarepresented as physical (e.g., electronic) quantities within thecomputer system's registers and memories into other data similarlyrepresented as physical within the computer system memories or registersor other such information storage or display devices. Implementations ofthe methods described herein may be implemented using computer software.If written in a programming language conforming to a recognizedstandard, sequences of instructions designed to implement the methodscan be compiled for execution on a variety of hardware platforms and forinterface to a variety of operating systems. In addition,implementations of the present disclosure are not described withreference to any particular programming language. It will be appreciatedthat a variety of programming languages may be used to implementimplementations of the present disclosure.

It should be noted that the methods and apparatus described herein arenot limited to use only with medical diagnostic imaging and treatment.In alternative implementations, the methods and apparatus herein may beused in applications outside of the medical technology field, such asindustrial imaging and non-destructive testing of materials. In suchapplications, for example, “treatment” may refer generally to theeffectuation of an operation controlled by the treatment planningsystem, such as the application of a beam (e.g., radiation, acoustic,etc.) and “target” may refer to a non-anatomical object or area.

In the foregoing specification, the disclosure has been described withreference to specific exemplary implementations thereof. It will,however, be evident that various modifications and changes may be madethereto without departing from the broader spirit and scope of thedisclosure as set forth in the appended claims. The specification anddrawings are, accordingly, to be regarded in an illustrative senserather than a restrictive sense.

What is claimed is:
 1. A phantom comprising a spherical phantom body and an X-ray luminescent material, wherein at least a portion of the X-ray luminescent material is on a surface of the phantom.
 2. The phantom of claim 1, wherein the X-ray luminescent material is an X-ray scintillation material with superficial build-up material.
 3. The phantom of claim 1, wherein the X-ray luminescent material is a dielectric material comprising water or plastic doped with a fluorescent compound to generate a Cerenkov optical signal in response to a radiation beam incident on the phantom.
 4. The phantom of claim 1, wherein: the phantom comprises a structure, the structure having a cavity; the phantom has a transparency that allows acquiring, using one camera at one location, of an image of an entrance feature of a radiation beam entering the phantom and an exit feature of the radiation beam exiting the phantom.
 5. The phantom of claim 1, wherein: the spherical phantom body comprises an opaque substrate; opaqueness of the phantom does not allow acquiring, using one camera at one location, of an image of an entrance feature of a radiation beam entering the phantom and an exit feature of the radiation beam exiting the phantom.
 6. The phantom of claim 1, wherein: the surface of the phantom is uniform; a relationship of optical signal to absorbed source is constant over the surface of the phantom; the optical signal is a measurement of a radiation beam incident to the surface; and the absorbed source is a measurement of absorption of the radiation beam in the phantom.
 7. The phantom of claim 1, wherein a pattern of visually identifiable features at relative positions is overlaid on the surface of the phantom.
 8. The phantom of claim 7, wherein the pattern is a checkerboard pattern.
 9. A phantom comprising a cylindrical phantom body and an X-ray luminescent material, wherein at least a portion of the X-ray luminescent material is on a surface of the phantom.
 10. The phantom of claim 9, wherein the X-ray luminescent material is an X-ray scintillation material with superficial build-up material.
 11. The phantom of claim 9, wherein the X-ray luminescent material is a dielectric material comprising water or plastic doped with a fluorescent compound to generate a Cerenkov optical signal in response to a radiation beam incident on the phantom.
 12. The phantom of claim 9, wherein: the phantom comprises a structure, the structure having a cavity; the phantom has a transparency that allows acquiring, using one camera at one location, of an image of an entrance feature of a radiation beam entering the phantom and an exit feature of the radiation beam exiting the phantom.
 13. The phantom of claim 9, wherein: the cylindrical phantom body comprises an opaque substrate; opaqueness of the phantom does not allow acquiring, using one camera at one location, of an image of an entrance feature of a radiation beam entering the phantom and an exit feature of the radiation beam exiting the phantom.
 14. The phantom of claim 9, wherein: surface of the phantom is uniform; a relationship of optical signal to absorbed source is constant over the surface of the phantom; the optical signal is a measurement of a radiation beam incident to the surface; and the absorbed source is a measurement of absorption of the radiation beam in the phantom.
 15. The phantom of claim 9, wherein a pattern of visually identifiable features at relative positions is overlaid on the surface of the phantom.
 16. The phantom of claim 15, wherein the pattern is a checkerboard pattern. 